lug3333/h0 ligitek electronics co.,ltd. property of ligitek only data sheet doc. no : qw0905-lug 3333/h0 rev. : a date : 18 - oct - 2005 super bright round type led lamps
0 x 60 x 100% 75% 0 25% 50% -60 x 50% 100% 75% 25% -30 x 30 x page 1/4 ligitek electronics co.,ltd. property of ligitek only part no. lug3333/h0 package dimensions directivity radiation note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. + - 2.54typ 1.0min 25.0min 7.6 8.6 5.0 5.9 ?? 0.5 typ 1.5max
part no. lug3333/h0 min. ligitek electronics co.,ltd. property of ligitek only unit ug ratings page 2/4 symbol parameter absolute maximum ratings at ta=25 j ma ma mw g a 30 120 100 10 j -40 ~ +100 max 260 j for 5 sec max (2mm from body) -40 ~ +85 j i f i fp pd ir forward current power dissipation reverse current @5v peak forward current duty 1/10@10khz tstg tsol storage temperature soldering temperature operating temperature t opr min. typ. 450 38 700 max. 574 20 1.7 2.6 dominant wave length f dnm luminous intensity @20ma(mcd) viewing angle 2 c 1/2 (deg) forward voltage @20ma(v) spectral halfwidth ??f nm lens emitted color water clear green part no lug3333/h0 material algainp typical electrical & optical characteristics (ta=25 j ) note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. electrostatic discharge esd 2000 v
3.0 2.5 1.5 1.0 0.5 0.0 2.0 fig.4 relative intensity vs. temperature relative intensity@20ma wavelength (nm) 500 0.0 0.5 550 600 650 ambient temperature( j ) fig.5 relative intensity vs. wavelength fig.3 forward voltage vs. temperature forward voltage@20ma normalize @25 j 1.0 -40 0.8 -20 1.1 1.0 0.9 1.2 relative intensity@20ma normalize @25 j 20 060 40 100 80 100 20 ambient temperature( j ) -20 -40 060 40 80 typical electro-optical characteristics curve 3.0 2.5 2.0 1.5 1.0 0.5 0.0 ligitek electronics co.,ltd. property of ligitek only fig.2 relative intensity vs. forward current fig.1 forward current vs. forward voltage forward voltage(v) 100 forward current(ma) 1.0 0.1 1.0 10 ug chip 1000 relative intensity normalize @20ma 2.0 3.0 1000 forward current(ma) 1.010100 4.0 5.0 page3/4 part no. lug3333/h0
part no. lug3333/h0 reference standard page 4/4 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 mil-std-202:103b jis c 7021: b-11 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 description test condition test item reliability test: this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) the purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. 1.ta=65 j? 5 j 2.rh=90 %~95% 3.t=240hrs ? 2hrs 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. operating life test low temperature storage test high temperature storage test high temperature high humidity test thermal shock test the purpose of this test is the resistance of the device under tropical for hous. ligitek electronics co.,ltd. property of ligitek only mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec this test intended to see soldering well performed or not. solderability test mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. solder resistance test
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